Temporal averaging of phase measurements in the presence of spurious phase drift: Application to phase-stepped real-time holographic interferometry

B. Ovryn; E. M. Haacke

doi:10.1364/AO.32.000147

Temporal averaging of phase measurements in the presence of spurious phase drift: Application to phase-stepped real-time holographic interferometry

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	147-154
Number of pages	8
Journal	Applied Optics
Volume	32
Issue number	2
DOIs	https://doi.org/10.1364/AO.32.000147
State	Published - Jan 10 1993
Externally published	Yes

ASJC Scopus Subject Areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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Temporal averaging of phase measurements in the presence of spurious phase drift: Application to phase-stepped real-time holographic interferometry

ASJC Scopus Subject Areas

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