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Surface modification of Sylgard 184 polydimethylsiloxane by 254 nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy

  • Emanuel A. Waddell
  • , Stephen Shreeves
  • , Holly Carrell
  • , Christopher Perry
  • , Branden A. Reid
  • , James McKee

Research output: Contribution to journal › Article › peer-review

Original languageEnglish
Pages (from-to)5314-5318
Number of pages5
JournalApplied Surface Science
Volume254
Issue number17
DOIs
StatePublished - Jun 30 2008
Externally publishedYes

ASJC Scopus Subject Areas

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Keywords

  • Contact angle
  • Excimer
  • Microscopy
  • Polydimethylsiloxane
  • Surface modification
  • Wettability

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