Surface modification of Sylgard 184 polydimethylsiloxane by 254 nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy

Emanuel A. Waddell, Stephen Shreeves, Holly Carrell, Christopher Perry, Branden A. Reid, James McKee

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)5314-5318
Number of pages5
JournalApplied Surface Science
Volume254
Issue number17
DOIs
StatePublished - Jun 30 2008

ASJC Scopus Subject Areas

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Keywords

  • Contact angle
  • Excimer
  • Microscopy
  • Polydimethylsiloxane
  • Surface modification
  • Wettability

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