Performance Analysis of an Optoelectronic Localization System for Monitoring Brain Lesioning with Proton Beams

Fadi Shihadeh, Reinhard Schulte, Keith Schubert, Pani Chakrapani

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Monitoring of the target position relative to the beam delivery system is a crucial requirement for creating small functional lesions in the brain with any radiosurgery modality. We have studied the performance of an optoelectronic localization system for monitoring brain lesioning with narrow proton beams. The system consists of three high-resolution cameras and dedicated software to locate a marker set in space. We tested the accuracy of the system by performing marker distance measurements and monitoring prescribed marker shifts with two different camera configurations and four different calibration techniques. Our results show that the camera-based alignment system appears adequate for the proposed task. © 2007 IEEE.
Original languageAmerican English
Title of host publication2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
Pages4693-4698
Number of pages6
Volume2007
DOIs
StatePublished - Aug 1 2007
Event29th Annual International Conference of IEEE-EMBS, Engineering in Medicine and Biology Society, EMBC'07 - Lyon, France
Duration: Aug 23 2007Aug 26 2007

Publication series

NameInternational Conference of the IEEE Engineering in Medicine and Biology Society

Conference

Conference29th Annual International Conference of IEEE-EMBS, Engineering in Medicine and Biology Society, EMBC'07
Country/TerritoryFrance
CityLyon
Period8/23/078/26/07

ASJC Scopus Subject Areas

  • Signal Processing
  • Biomedical Engineering
  • Computer Vision and Pattern Recognition
  • Health Informatics

Keywords

  • Photography
  • Protons
  • Monitoring, Physiologic
  • Humans
  • Brain Mapping
  • Electronics
  • Brain Injuries/diagnosis
  • Calibration
  • Equipment Design

Disciplines

  • Computer Sciences
  • Semiconductor and Optical Materials
  • Electrical and Electronics
  • Artificial Intelligence and Robotics

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