An approach to the establishment of technique/exposure ranges in diagnostic radiology

Lawrence N. Rothenberg, Daniel W. Miller, James F. Caravelli

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)217-224
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume233
DOIs
StatePublished - Aug 18 1980

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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